Jean-Jacques Hajjar : rechercher sur Z-Library

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1

[IEEE 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) - Shanghai, China (2010.11.1-2010.11.4)] 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology - Recent progress in testing, characterization and protection for CDM ESD events

Zhou, Yuanzhong, Righter, Alan W., Hajjar, Jean-Jacques

Année:

2010

Langue:

english

Fichier:

PDF, 336 KB

english, 2010

2

vfTLP-VTH: A new method for quantifying the effectiveness of ESD protection for the CDM classification test

Zhou, Yuanzhong, Ellis, David, Hajjar, Jean-Jacques, Olney, Andrew, Liou, Juin J.

Journal:

Microelectronics Reliability

Année:

2013

Langue:

english

Fichier:

PDF, 985 KB

english, 2013

3

Compact failure modeling for devices subject to electrostatic discharge stresses – A review pertinent to CMOS reliability simulation

Miao, Meng, Zhou, Yuanzhong, Salcedo, Javier A., Hajjar, Jean-Jacques, Liou, Juin J.

Journal:

Microelectronics Reliability

Année:

2015

Langue:

english

Fichier:

PDF, 1.65 MB

english, 2015

4

[IEEE 2013 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Suzhou, China (2013.07.15-2013.07.19)] Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Failure analysis considerations in designing for EOS/ESD robustness

Hajjar, Jean-Jacques, Righter, Alan, Wolfe, Ed, Olney, Andrew

Année:

2013

Langue:

english

Fichier:

PDF, 668 KB

english, 2013

5

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Monolithic ESD protection for distributed high speed applications in 28-nm CMOS technology

Salcedo, Javier A., Parthasarathy, Srivatsan, Hajjar, Jean-Jacques

Année:

2014

Langue:

english

Fichier:

PDF, 313 KB

english, 2014

6

[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - CDM ESD failure modes and VFTLP testing for protection evaluation

Zhou, Yuanzhong, Hajjar, Jean-Jacques

Année:

2008

Langue:

english

Fichier:

PDF, 1.61 MB

english, 2008

7

[IEEE 2013 IEEE 10th International Conference on ASIC (ASICON 2013) - Shenzhen, China (2013.10.28-2013.10.31)] 2013 IEEE 10th International Conference on ASIC - Investigation on effectiveness of series gate resistor in CDM ESD protection designs

Zhou, Yuanzhong, Righter, Alan W., Hajjar, Jean-Jacques

Année:

2013

Langue:

english

Fichier:

PDF, 301 KB

english, 2013

8

Compact Thermal Failure Model for Devices Subject to Electrostatic Discharge Stresses

Zhou, Yuanzhong, Miao, Meng, Salcedo, Javier A., Hajjar, Jean-Jacques, Liou, Juin J.

Journal:

IEEE Transactions on Electron Devices

Année:

2015

Langue:

english

Fichier:

PDF, 4.12 MB

english, 2015

9

[IEEE 2009 IEEE International Reliability Physics Symposium - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Prediction of Gate Dielectric Breakdown in the CDM timescale utilizing very fast transmission line pulsing

Ellis, David F., Malobabic, Slavica, Liou, Juin J., Hajjar, Jean-Jacques

Année:

2009

Langue:

english

Fichier:

PDF, 247 KB

english, 2009

10

[IEEE 2014 IEEE International Reliability Physics Symposium (IRPS) - Waikoloa, HI, USA (2014.6.1-2014.6.5)] 2014 IEEE International Reliability Physics Symposium - Design of a low leakage ESD clamp for high voltage supply in 65nm CMOS technology

Parthasarathy, Srivatsan, Salcedo, Javier A., Hajjar, Jean-Jacques

Année:

2014

Langue:

english

Fichier:

PDF, 489 KB

english, 2014

11

[IEEE 2008 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT) - Beijing, China (2008.10.20-2008.10.23)] 2008 9th International Conference on Solid-State and Integrated-Circuit Technology - Electrostatic discharge protection framework for mixed-signal high voltage CMOS applications

Salcedo, Javier A., Zhu, Haiyang, Righter, Alan W., Hajjar, Jean-Jacques

Année:

2008

Langue:

english

Fichier:

PDF, 2.80 MB

english, 2008

12

In Situ ESD Protection Structure for Variable Operating Voltage Interface Applications in 28-nm CMOS Process

Luo, Sirui, Salcedo, Javier A., Parthasarathy, Srivatsan, Zhou, Yuanzhong, Hajjar, Jean-Jacques, Liou, Juin J.

Journal:

IEEE Transactions on Device and Materials Reliability

Année:

2014

Langue:

english

Fichier:

PDF, 1.46 MB

english, 2014

13

[IEEE 2016 IEEE International Nanoelectronics Conference (INEC) - Chengdu, China (2016.5.9-2016.5.11)] 2016 IEEE International Nanoelectronics Conference (INEC) - Novel structure embedded with dual-diodes and silicon controlled rectifier for high speed I/O applications

Dong, Aihua, Miao, Meng, Liou, Juin J., Salcedo, Javier A., Hajjar, Jean-Jacques

Année:

2016

Langue:

english

Fichier:

PDF, 302 KB

english, 2016

14

ESD protection structure with reduced capacitance and overshoot voltage for high speed interface applications

Dong, Aihua, Salcedo, Javier A., Parthasarathy, Srivatsan, Zhou, Yuanzhong, Luo, Sirui, Hajjar, Jean-Jacques, Liou, Juin J.

Journal:

Microelectronics Reliability

Année:

2017

Langue:

english

Fichier:

PDF, 1.53 MB

english, 2017

15

[IEEE 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Chengdu, China (2017.7.4-2017.7.7)] 2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Heterogeneous stacking silicon controlled rectifier design with improved ESD performance

Dong, Aihua, He, Linfeng, Liang, Wei, Salcedo, Javier A., Hajjar, Jean-Jacques, Liou, Juin J., Sundaram, Kalpathy B.

Année:

2017

Langue:

english

Fichier:

PDF, 304 KB

english, 2017

16

[IEEE 2018 18th International Workshop on Junction Technology (IWJT) - Shanghai (2018.3.8-2018.3.9)] 2018 18th International Workshop on Junction Technology (IWJT) - Thermal failure and voltage overshoot models for diode behavior under electrostatic discharge stresses

Li, Hang, Zhou, Yuanzhong, Miao, Meng, Salcedo, Javier A., Hajjar, Jean-Jacques, Sundaram, Kalpathy B.

Année:

2018

Langue:

english

Fichier:

PDF, 263 KB

english, 2018

17

Compact and Fast-Response Voltage Clamp for Bi-Directional Signal Swing Interface Applications

He, Linfeng, Salcedo, Javier A., Parthasarathy, Srivatsan, Zhou, Yuanzhong, Hajjar, Jean-Jacques, Sundaram, Kalpathy

Journal:

IEEE Electron Device Letters

Année:

2018

Langue:

english

Fichier:

PDF, 1.41 MB

english, 2018

18

[IEEE 2019 41st Annual EOS/ESD Symposium (EOS/ESD) - Riverside, CA, USA (2019.9.15-2019.9.20)] 2019 41st Annual EOS/ESD Symposium (EOS/ESD) - ESD Protection Impact and Modelling of Bias-Dependent Series Resistance in Diodes

Zhou, Yuanzhong Paul, Ding, Guanghai, Hajjar, Jean-Jacques

Année:

2019

Langue:

english

Fichier:

PDF, 783 KB

english, 2019

19

Outbreak of acute hemorrhagic conjunctivitis in French Guiana and West Indies caused by coxsackievirus A24 variant: Phylogenetic analysis reveals Asian import

Philippe Dussart, Gaëlle Cartet, Pierre Huguet, Nicolas Lévêque, Christian Hajjar, Jacques Morvan, Julie Vanderkerckhove, Karine Ferret, Bruno Lina, Jean-Jacques Chomel, Helene Norder

Journal:

Journal of Medical Virology

Année:

2005

Langue:

english

Fichier:

PDF, 168 KB

english, 2005

20

Calcium-prostaglandin aggregation and its effect on prostaglandin uptake by isolated rabbit intestine

Anwar B. Bikhazi, Nabil S. Nadir, Jean-Jacques Hajjar

Journal:

Journal of Pharmaceutical Sciences

Année:

1977

Langue:

english

Fichier:

PDF, 575 KB

english, 1977

21

Modeling of high voltage devices for ESD event simulation in SPICE

Yuanzhong (Paul) Zhou, Javier A. Salcedo, Jean-Jacques Hajjar

Journal:

Microelectronics Journal

Année:

2012

Langue:

english

Fichier:

PDF, 1.08 MB

english, 2012

22

Alanine influx across serosal border of Testudo graeca intestine

Camille F. Nassar, Raja N. Khuri, Jean-Jacques Hajjar

Journal:

Biochimica et Biophysica Acta (BBA) - Biomembranes

Année:

1980

Langue:

english

Fichier:

PDF, 309 KB

english, 1980

23

Effects of vanadate on water and electrolyte transport in rat jejunum

Jean-Jacques Hajjar, Salam Zakko, Tanja K. Tomicic

Journal:

Biochimica et Biophysica Acta (BBA) - Biomembranes

Année:

1986

Langue:

english

Fichier:

PDF, 282 KB

english, 1986

24

The transmural potential difference and short-circuit current across the small intestine

Jean-Jacques Hajjar, Rashid Nassar, Hrair Kurkjian, Raja N. Khuri

Journal:

Comparative Biochemistry and Physiology

Année:

1969

Langue:

english

Fichier:

PDF, 429 KB

english, 1969

25

Intestinal absorption in the mechanically obstructed rat intestine: Protection by prostaglandins

Jean-Jacques Hajjar, Brian Van Linda, John Fucci, Tanja Tomicic

Journal:

Année:

1986

Langue:

english

Fichier:

PDF, 468 KB

english, 1986

26

Effect of vitamin a on in vitro alanine transport in isolated rabbit ileum

Hajjar, Jean-Jacques, Nassar, Kamil, Bikhazi, Anwar

Journal:

Comparative Biochemistry and Physiology Part A: Physiology

Année:

1977

Langue:

english

Fichier:

PDF, 432 KB

english, 1977

27

Lysine transport in turtle ventricle—II. Effect of extracellular ions and ouabain on lysine fluxes

Hajjar, Jean-Jacques, Khuri, Raja N., Bizri, Hana

Journal:

Comparative Biochemistry and Physiology Part A: Physiology

Année:

1973

Langue:

english

Fichier:

PDF, 538 KB

english, 1973

28

Ion transport in proximal and distal halves of turtle colon

Hajjar, Jean-Jacques

Journal:

Comparative Biochemistry and Physiology Part A: Physiology

Année:

1971

Langue:

english

Fichier:

PDF, 485 KB

english, 1971

29

Lysine transport in turtle ventricle-I. Effect of ouabain and extracellular ions on lysine accumulation

Hajjar, Jean-Jacques, Khuri, Raja N., Bizri, Hana

Journal:

Comparative Biochemistry and Physiology Part A: Physiology

Année:

1973

Langue:

english

Fichier:

PDF, 891 KB

english, 1973

30

Determination of extracellular space in small intestine

Hajjar, Jean-Jacques, Bitar, Khalil

Journal:

Comparative Biochemistry and Physiology Part A: Physiology

Année:

1977

Langue:

english

Fichier:

PDF, 498 KB

english, 1977

31

Mechanism of cholesterol absorption by the hydatid cysts of Echinococcus granulosus (Cestoda)

Bahr, Jurjus M, Frayha, George J, Hajjar, Jean-Jacques

Journal:

Comparative Biochemistry and Physiology Part A: Physiology

Année:

1979

Langue:

english

Fichier:

PDF, 586 KB

english, 1979

32

Pyridoxine transport across the turtle, rat and rabbit intestines

Hajjar, Jean-Jacques, Nassar, Kamil

Journal:

Comparative Biochemistry and Physiology Part A: Physiology

Année:

1975

Langue:

english

Fichier:

PDF, 454 KB

english, 1975

33

The effect of vitamin B6 on alanine transport in turtle intestine

Hajjar, Jean-Jacques, Khatib, Abdul-Hamid

Journal:

Comparative Biochemistry and Physiology Part A: Physiology

Année:

1974

Langue:

english

Fichier:

PDF, 733 KB

english, 1974

34

Alanine flux across rabbit peyer's patches

Hajjar, Jean-Jacques, Hawrani, Mukbil, Khuri, Raja N.

Journal:

Comparative Biochemistry and Physiology Part A: Physiology

Année:

1972

Langue:

english

Fichier:

PDF, 787 KB

english, 1972

35

[IEEE 2012 International Caribbean Conference on Devices, Circuits and Systems (ICCDCS) - Playa del Carmen, Mexico (2012.03.14-2012.03.17)] 2012 8th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS) - On-chip protection for automotive integrated circuits robustness

Salcedo, Javier A., Clarke, Dave, Hajjar, Jean-Jacques

Année:

2012

Langue:

english

Fichier:

PDF, 425 KB

english, 2012

36

[IEEE 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Capri, Italy (2009.10.12-2009.10.14)] 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - SiGe bipolar transistor modeling for a full chip ESD simulation

Parthasarathy, Srivatsan, Coram, Geoffrey J., Salcedo, Javier A., Hajjar, Jean-Jacques

Année:

2009

Langue:

english

Fichier:

PDF, 526 KB

english, 2009

37

NLDMOS ESD Scaling Under Human Metal Model for 40-V Mixed-Signal Applications

Malobabic, Slavica, Salcedo, Javier A., Hajjar, Jean-Jacques, Liou, Juin J.

Journal:

IEEE Electron Device Letters

Année:

2012

Langue:

english

Fichier:

PDF, 215 KB

english, 2012

38

ESD Protection Device With Dual-Polarity Conduction and High Blocking Voltage Realized in CMOS Process

Luo, Sirui, Salcedo, Javier A., Hajjar, Jean-Jacques, Zhou, Yuanzhong, Liou, Juin J.

Journal:

IEEE Electron Device Letters

Année:

2014

Langue:

english

Fichier:

PDF, 439 KB

english, 2014

39

[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - Power supply clamp for multi-domain mixed-signal SiGe BiCMOS applications

Salcedo, J. A., Parthasarathy, S., Hajjar, Jean-Jacques

Année:

2013

Langue:

english

Fichier:

PDF, 626 KB

english, 2013

40

[IEEE 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Atlanta, GA, USA (2011.10.9-2011.10.11)] 2011 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - Design of SCR devices for SiGe BiCMOS applications

Parthasarathy, Srivatsan, Salcedo, Javier A., Hajjar, Jean-Jacques

Année:

2011

Langue:

english

Fichier:

PDF, 707 KB

english, 2011

41

Correlation of Human Metal Model and Transmission Line Pulsing Testing

Malobabic, Slavica, Salcedo, Javier A., Righter, Alan W., Hajjar, Jean-Jacques, Liou, Juin J.

Journal:

IEEE Electron Device Letters

Année:

2011

Langue:

english

Fichier:

PDF, 179 KB

english, 2011

42

[IEEE 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting - BCTM - Bordeaux, France (2013.09.30-2013.10.3)] 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM) - A transient triggered bipolar clamp for electrostatic discharge protection in SiGe BiCMOS technologies

Parthasarathy, Srivatsan, Salcedo, Javier A., Hajjar, Jean-Jacques

Année:

2013

Langue:

english

Fichier:

PDF, 1.25 MB

english, 2013

43

[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Compact Modeling of On-Chip ESD Protection Using Standard MOS and BJT Models

Zhou, Yuanzhong, Hajjar, Jean-jacques, Lisiak, Kenneth

Année:

2006

Langue:

english

Fichier:

PDF, 97 KB

english, 2006

44

[IEEE 2009 IEEE International Reliability Physics Symposium (IRPS) - Montreal, QC, Canada (2009.04.26-2009.04.30)] 2009 IEEE International Reliability Physics Symposium - Very fast transient simulation and measurement methodology for ESD technology development

Malobabic, Slavica, Ellis, David F., Liou, Juin J., Salcedo, Javier A., Hajjar, Jean-Jacques, Yuanzhong Zhou,

Année:

2009

Langue:

english

Fichier:

PDF, 683 KB

english, 2009

45

[IEEE 2007 IEEE Conference on Electron Devices and Solid-State Circuits - Tainan, Taiwan (2007.12.20-2007.12.22)] 2007 IEEE Conference on Electron Devices and Solid-State Circuits - ESD Simulation using Compact Models: from I/O Cell to Full Chip

Zhou, Yuanzhong, Weyl, Thorsten, Hajjar, Jean-Jacques, Lisiak, Kenneth P.

Année:

2007

Langue:

english

Fichier:

PDF, 6.34 MB

english, 2007

46

[IEEE 2013 IEEE International Reliability Physics Symposium (IRPS) - Anaheim, CA (2013.4.14-2013.4.18)] 2013 IEEE International Reliability Physics Symposium (IRPS) - A low leakage poly-gated SCR device for ESD protection in 65nm CMOS process

Parthasarathy, S., Salcedo, J. A., Hajjar, Jean-Jacques

Année:

2013

Langue:

english

Fichier:

PDF, 367 KB

english, 2013

47

[IEEE 2008 7th International Caribbean Conference on Devices, Circuits and Systems (ICCDCS) - Cancun, Mexico (2008.04.28-2008.04.30)] 2008 7th International Caribbean Conference on Devices, Circuits and Systems - Gate oxide evaluation under very fast transmission line pulse (VFTLP) CDM-type stress

Malobabic, Slavica, Ellis, David F., Salcedo, Javier A., Zhou, Yuanzhong, Hajjar, Jean-Jacques, Liou, Juin J.

Année:

2008

Langue:

english

Fichier:

PDF, 1.75 MB

english, 2008

48

[IEEE 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Chengdu, China (2014.6.18-2014.6.20)] 2014 IEEE International Conference on Electron Devices and Solid-State Circuits - A circuit model of electrostatic discharge generators for ESD and EMC SPICE simulation

Zhou, Yuanzhong, Hajjar, Jean-Jacques

Année:

2014

Langue:

english

Fichier:

PDF, 522 KB

english, 2014

49

On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits ||

Cui, Qiang, Liou, Juin J., Hajjar, Jean-Jacques, Salcedo, Javier, Zhou, Yuanzhong, Srivatsan, Parthasarathy

Année:

2015

Langue:

english

Fichier:

PDF, 8.65 MB

english, 2015

50

On-Chip Electro-Static Discharge (ESD) Protection for Radio-Frequency Integrated Circuits || On-Chip Radio Frequency ESD Protection Solution in GaAs pHEMT Process

Cui, Qiang, Liou, Juin J., Hajjar, Jean-Jacques, Salcedo, Javier, Zhou, Yuanzhong, Srivatsan, Parthasarathy

Année:

2015

Langue:

english

Fichier:

PDF, 4.84 MB

english, 2015